Số hiệu tiêu chuẩn
EN 60749-4
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2002)
Ngày phát hành
2002-08-00
Tiêu chuẩn tương đương
DIN EN 60749-4 (2003-04), IDT * BS EN 60749-4 (2002-09-10), IDT * NF C96-022-4 (2002-12-01), IDT * IEC 60749-4 (2002-04), IDT * OEVE/OENORM EN 60749-4 (2003-10-01), IDT * PN-EN 60749-4 (2003-10-15), IDT * PN-EN 60749-4 (2004-08-23), IDT * SS-EN 60749-4 (2003-10-20), IDT * UNE-EN 60749-4 (2003-05-30), IDT * TS EN 60749-4 (2004-04-15), IDT * STN EN 60749-4 (2003-02-01), IDT * CSN EN 60749-4 (2003-04-01), IDT * DS/EN 60749-4 (2003-01-08), IDT * NEN-EN-IEC 60749-4:2002 en;fr (2002-09-01), IDT
Từ khóa
Climate * Climatic tests * Components * Damp-heat tests * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Mechanical testing * Semiconductor devices * Semiconductors * Stress tests * Testing