Số hiệu tiêu chuẩn
prEN 60749-14
Tên tiêu chuẩn
IEC 60749-14, Ed. 1: Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Ngày phát hành
2002-03-00
Tiêu chuẩn tương đương
DIN EN 60749-14 (2002-09), IDT * C96-022-14PR, IDT * IEC 47/1615/CDV (2002-03), IDT * OEVE/OENORM EN 60749-14 (2002-06-01), IDT
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Flat pack * Heat * Integrated circuits * Mechanical testing * Metal casings * Moisture * Resistance * Semiconductor devices * Semiconductors * Temperature * Testing * Testing conditions * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density