Số hiệu tiêu chuẩn
EN 60749-24
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)
Ngày phát hành
2004-04-00
Tiêu chuẩn tương đương
DIN EN 60749-24 (2004-09), IDT * BS EN 60749-24 (2004-06-24), IDT * NF C96-022-24 (2005-12-01), IDT * IEC 60749-24 (2004-03), IDT * IEC 60749-24 (2005-11), IDT * SN EN 60749-24 (2004), IDT * OEVE/OENORM EN 60749-24 (2004-11-01), IDT * PN-EN 60749-24 (2005-03-15), IDT * PN-EN 60749-24 (2006-08-24), IDT * SS-EN 60749-24 (2004-06-28), IDT * UNE-EN 60749-24 (2005-03-16), IDT * TS EN 60749-24 (2008-05-22), IDT * STN EN 60749-24 (2004-10-01), IDT * CSN EN 60749-24 (2004-12-01), IDT * DS/EN 60749-24 (2004-06-14), IDT * NEN-EN-IEC 60749-24:2004 en (2004-05-01), IDT
Từ khóa
Bond strength * Climatic tests * Components * Destructive testing * Electrical engineering * Electronic engineering * Electronic equipment and components * Environmental testing * Environmental tests * Failure analysis * Failure frequency * Failure rates * Integrated circuits * Mechanical testing * Moisture resistance * Semiconductor devices * Semiconductors * Statistics of failure * Testing