Số hiệu tiêu chuẩn
EN 60749-5
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003)
Ngày phát hành
2003-03-00
Tiêu chuẩn tương đương
DIN EN 60749-5 (2003-09), IDT * BS EN 60749-5 (2003-06-18), IDT * BS EN 60749-24 (2004-06-24), IDT * NF C96-022-5 (2003-06-01), IDT * IEC 60749-5 (2003-01), IDT * SN EN 60749-5 (2003-02), IDT * OEVE/OENORM EN 60749-5 (2003-10-01), IDT * PN-EN 60749-5 (2003-12-15), IDT * PN-EN 60749-5 (2005-08-30), IDT * SS-EN 60749-5 (2003-10-20), IDT * UNE-EN 60749-5 (2003-11-21), IDT * TS EN 60749-5 (2008-04-10), IDT * STN EN 60749-5 (2003-10-01), IDT * CSN EN 60749-5 (2003-11-01), IDT * DS/EN 60749-5 (2003-08-11), IDT * NEN-EN-IEC 60749-5:2003 en;fr (2003-07-01), IDT
Tiêu chuẩn liên quan
EN 60994-4 (2002) * IEC 60749-4 (2002-04)
Từ khóa
Climate * Climatic tests * Components * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Life (durability) * Mechanical testing * Moisture test * Semiconductor devices * Semiconductors * Temperature test * Testing