Số hiệu tiêu chuẩn
EN 60749-18
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002)
Ngày phát hành
2003-02-00
Tiêu chuẩn tương đương
DIN EN 60749-18 (2003-09), IDT * BS EN 60749-18 (2003-03-13), IDT * NF C96-022-18 (2003-05-01), IDT * IEC 60749-18 (2002-12), IDT * SN EN 60749-18 (2003-02), IDT * OEVE/OENORM EN 60749-18 (2003-10-01), IDT * PN-EN 60749-18 (2003-12-15), IDT * PN-EN 60749-18 (2005-12-13), IDT * SS-EN 60749-18 (2003-10-20), IDT * UNE-EN 60749-18 (2003-11-21), IDT * TS EN 60749-18 (2008-04-29), IDT * STN EN 60749-18 (2003-10-01), IDT * CSN EN 60749-18 (2003-08-01), IDT * DS/EN 60749-18 (2003-05-09), IDT * NEN-EN-IEC 60749-18:2003 en;fr (2003-07-01), IDT
Từ khóa
Climate * Climatic tests * Components * Definitions * Destructive testing * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Ionizing radiation * Mechanical testing * Military equipment * Multilingual * Radiation effects * Semiconductor devices * Semiconductors * Space transport * Testing