Số hiệu tiêu chuẩn
EN 60749-25
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003)
Ngày phát hành
2003-09-00
Tiêu chuẩn tương đương
DIN EN 60749-25 (2004-04), IDT * BS EN 60749-25 (2003-10-30), IDT * NF C96-022-25 (2003-12-01), IDT * IEC 60749-25 (2003-07), IDT * SN EN 60749-25 (2003), IDT * OEVE/OENORM EN 60749-25 (2004-05-01), IDT * PN-EN 60749-25 (2004-06-15), IDT * PN-EN 60749-25 (2006-01-27), IDT * SS-EN 60749-25 (2003-11-17), IDT * UNE-EN 60749-25 (2004-06-11), IDT * TS EN 60749-25 (2008-04-29), IDT * STN EN 60749-25 (2004-03-01), IDT * CSN EN 60749-25 (2004-06-01), IDT * DS/EN 60749-25 (2004-03-15), IDT * NEN-EN-IEC 60749-25:2003 en;fr (2003-11-01), IDT
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Cycle-time * Definitions * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Heat * Integrated circuits * Mechanical testing * Moisture * Ratings * Resistance * Semiconductor devices * Semiconductors * Soldered joints * Stress * Temperature * Test on changes of temperature * Testing * Testing conditions * Thermal shock endurance * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density