This specification covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this specification is to establish a method for determining IC latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are extremely important in determining product reliability and minimizing No Trouble Found (NTF) and Electrical Overstress (EOS) failures due to latch-up. This test method is applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies. Classification There are two classes for latch-up testing. -- Class I is for testing at room temperature ambient. -- Class II is for testing at the maximum operating ambient temperature (Ta) or maximum operating case temperature (Tc) or maximum operating junction temperature (Tj) in the data sheet. For Class II testing at the maximum operating Ta or Tc, the ambient temperature or case temperature (Tc) shall be established at the required test value. For Class II testing at the maximum operating Tj, the ambient temperature Ta or the case temperature Tc should be selected to achieve a temperature characteristic of the junction temperature for a given device operating mode(s) during latch-up testing. The maximum operating ambient or case temperature during stress may be calculated based on the methods detailed in Annex B. The values used in Class II testing shall be recorded in the final report. NOTE Elevated temperature will reduce latch-up resistance, and class II testing is recommended for devices that are required to operate at elevated temperature. Level Level defines the I-test current injection value used during latch-up testing. Latch-up passing levels are defined as follows: Level A - The trigger current value in Table 1 shall be +100 mA as defined in Figure 5 and -100 mA as defined in Figure 6. If all pins on the part pass at least the Level A trigger current values, then the part shall be considered a Level A part. Level B - If any pins on the part do not pass the Level A standard, then the supplier shall determine the minimum passing trigger current requirement for each pin stressed differently than in Level A. The maximum (or highest) passing trigger current value shall be reported in the record for each pin stressed differently than in Level A, and the part shall be considered to be a Level B part, see 4.2.5.