Số hiệu tiêu chuẩn
EN 60749-17
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003)
Ngày phát hành
2003-04-00
Tiêu chuẩn tương đương
DIN EN 60749-17 (2003-09), IDT * BS EN 60749-17 (2003-06-19), IDT * NF C96-022-17 (2003-08-01), IDT * IEC 60749-17 (2003-02), IDT * SN EN 60749-17 (2003-04), IDT * OEVE/OENORM EN 60749-17 (2003-10-01), IDT * PN-EN 60749-17 (2003-12-15), IDT * PN-EN 60749-17 (2005-12-12), IDT * SS-EN 60749-17 (2003-10-20), IDT * UNE-EN 60749-17 (2003-11-21), IDT * STN EN 60749-17 (2003-11-01), IDT * CSN EN 60749-17 (2003-12-01), IDT * DS/EN 60749-17 (2003-07-08), IDT * NEN-EN-IEC 60749-17:2003 en;fr (2003-06-01), IDT
Từ khóa
Climate * Climatic tests * Components * Destructive testing * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Mechanical testing * Neutron radiation * Radiation effects * Semiconductor devices * Semiconductors * Testing