Loading data. Please wait

Tra cứu tiêu chuẩn  
Tìm kiếm nâng cao

IEC 60749-25*CEI 60749-25

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling

Số trang: 34
Ngày phát hành: 2003-07-00

Liên hệ
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.
Số hiệu tiêu chuẩn
IEC 60749-25*CEI 60749-25
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Ngày phát hành
2003-07-00
Trạng thái
Có hiệu lực
Tiêu chuẩn tương đương
DIN EN 60749-25 (2004-04), IDT * ABNT NBR IEC 60749-25 (2011-01-24), IDT * BS EN 60749-25 (2003-10-30), IDT * EN 60749-25 (2003-09), IDT * NF C96-022-25 (2003-12-01), IDT * OEVE/OENORM EN 60749-25 (2004-05-01), IDT * PN-EN 60749-25 (2004-06-15), IDT * PN-EN 60749-25 (2006-01-27), IDT * SS-EN 60749-25 (2003-11-17), IDT * UNE-EN 60749-25 (2004-06-11), IDT * STN EN 60749-25 (2004-03-01), IDT * CSN EN 60749-25 (2004-06-01), IDT * DS/EN 60749-25 (2004-03-15), IDT * NEN-EN-IEC 60749-25:2003 en;fr (2003-11-01), IDT
Tiêu chuẩn liên quan
IEC 60068-2-14*CEI 60068-2-14 (1984)
Basic environmental testing procedures. Part 2 : Tests. Test N: Change of temperature
Số hiệu tiêu chuẩn IEC 60068-2-14*CEI 60068-2-14
Ngày phát hành 1984-00-00
Mục phân loại 19.040. Thử môi trường
Trạng thái Có hiệu lực
Thay thế cho
IEC 47/1696/FDIS (2003-04) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t) * IEC/PAS 62178 (2000-08)
Thay thế bằng
Lịch sử ban hành
IEC 60749-25*CEI 60749-25*IEC 47/1696/FDIS (2003-04)*IEC 60749 (1996-10, t)*IEC 60749 AMD 1 (2000-07, t)*IEC 60749 AMD 2 (2001-10, t)*IEC 60749 Edition 2.2 (2002-04, t)*IEC/PAS 62178 (2000-08) * IEC 60749-25 (2003-07) * IEC 47/1696/FDIS (2003-04) * IEC 47/1616/CDV (2002-03) * IEC/PAS 62178 (2000-08)
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Cycle-time * Definitions * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Heat * Integrated circuits * Mechanical testing * Moisture * Ratings * Resistance * Semiconductor devices * Semiconductors * Soldered joints * Stress * Temperature * Test on changes of temperature * Testing * Testing conditions * Thermal shock endurance * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density
Mục phân loại
31.080.01. Thiết bị bán dẫn nói chung
Số trang
34

LOẠI TIÊU CHUẨN PHỔ BIẾN | TẤT CẢ LOẠI TIÊU CHUẨN