Số hiệu tiêu chuẩn
IEC 60749-5*CEI 60749-5
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Ngày phát hành
2003-01-00
Tiêu chuẩn tương đương
DIN EN 60749-5 (2003-09), IDT * BS EN 60749-5 (2003-06-18), IDT * BS EN 60749-24 (2004-06-24), IDT * EN 60749-5 (2003-03), IDT * NF C96-022-5 (2003-06-01), IDT * OEVE/OENORM EN 60749-5 (2003-10-01), IDT * PN-EN 60749-5 (2003-12-15), IDT * PN-EN 60749-5 (2005-08-30), IDT * SS-EN 60749-5 (2003-10-20), IDT * UNE-EN 60749-5 (2003-11-21), IDT * STN EN 60749-5 (2003-10-01), IDT * CSN EN 60749-5 (2003-11-01), IDT * DS/EN 60749-5 (2003-08-11), IDT * NEN-EN-IEC 60749-5:2003 en;fr (2003-07-01), IDT
Tiêu chuẩn liên quan
IEC 60749-4 (2002-04)
Thay thế cho
IEC 47/1661/FDIS (2002-10) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t) * IEC/PAS 62161 (2000-08)
Lịch sử ban hành
IEC 60749-5*CEI 60749-5*IEC 47/1661/FDIS (2002-10)*IEC 60749 (1996-10, t)*IEC 60749 AMD 1 (2000-07, t)*IEC 60749 AMD 2 (2001-10, t)*IEC 60749 Edition 2.2 (2002-04, t)*IEC/PAS 62161 (2000-08) * IEC 60749-5 (2003-01) * IEC 47/1661/FDIS (2002-10) * IEC 47/1600/CDV (2002-01) * IEC/PAS 62161 (2000-08)
Từ khóa
Climate * Climatic tests * Components * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Life (durability) * Mechanical testing * Moisture test * Semiconductor devices * Semiconductors * Temperature test * Testing
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