Số hiệu tiêu chuẩn
IEC 60749-36*CEI 60749-36
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Ngày phát hành
2003-02-00
Tiêu chuẩn tương đương
DIN EN 60749-36 (2003-12), IDT * BS EN 60749-36 (2003-06-19), IDT * EN 60749-36 (2003-04), IDT * NF C96-022-36 (2003-08-01), IDT * OEVE/OENORM EN 60749-36 (2004-01-01), IDT * PN-EN 60749-36 (2003-12-15), IDT * PN-EN 60749-36 (2005-12-13), IDT * SS-EN 60749-36 (2003-10-20), IDT * UNE-EN 60749-36 (2004-03-18), IDT * STN EN 60749-36 (2003-11-01), IDT * CSN EN 60749-36 (2003-12-01), IDT * DS/EN 60749-36 (2003-08-11), IDT * NEN-EN-IEC 60749-36:2003 en;fr (2003-06-01), IDT
Thay thế cho
IEC 47/1667/FDIS (2002-11) * IEC 60749 (1996-10, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t)
Lịch sử ban hành
IEC 60749-36*CEI 60749-36*IEC 47/1667/FDIS (2002-11)*IEC 60749 (1996-10, t)*IEC 60749 AMD 2 (2001-10, t)*IEC 60749 Edition 2.2 (2002-04, t) * IEC 60749-36 (2003-02) * IEC 47/1667/FDIS (2002-11) * IEC 47/1585/CDV (2001-11)
Từ khóa
Accelerate * Accelerated testing * Acceleration * Climate * Climatic tests * Components * Destructive testing * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Mechanical testing * Semiconductor devices * Semiconductors * Testing
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