Số hiệu tiêu chuẩn
IEC 60749-2*CEI 60749-2
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Ngày phát hành
2002-04-00
Tiêu chuẩn tương đương
DIN EN 60749-2 (2003-04), IDT * BS EN 60749-2 (2002-09-24), IDT * GB/T 4937.2 (2006), IDT * EN 60749-2 (2002-08), IDT * NF C96-022-2 (2002-12-01), IDT * OEVE/OENORM EN 60749-2 (2003-10-01), IDT * PN-EN 60749-2 (2003-08-15), IDT * PN-EN 60749-2 (2004-08-26), IDT * SS-EN 60749-2 (2003-10-20), IDT * UNE-EN 60749-2 (2003-05-30), IDT * TS EN 60749-2 (2004-04-15), IDT * STN EN 60749-2 (2003-02-01), IDT * CSN EN 60749-2 (2003-04-01), IDT * DS/EN 60749-2 (2003-01-08), IDT * NEN-EN-IEC 60749-2:2002 en;fr (2002-09-01), IDT
Thay thế cho
IEC 47/1601/FDIS (2002-01) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t)
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Heat * Integrated circuits * Mechanical testing * Moisture * Resistance * Semiconductor devices * Semiconductors * Temperature * Testing * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density
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