Số hiệu tiêu chuẩn
IEC 60749-1*CEI 60749-1
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Ngày phát hành
2002-08-00
Tiêu chuẩn tương đương
DIN EN 60749-1 (2003-12), IDT * ABNT NBR IEC 60749-1 (2010-02-11), IDT * ABNT NBR IEC 60749-4 (2010-06-29), IDT * BS EN 60749-1 (2003-07-07), IDT * GB/T 4937.1 (2006), IDT * EN 60749-1 (2003-06), IDT * NF C96-022-1 (2003-11-01), IDT * OEVE/OENORM EN 60749-1 (2004-01-01), IDT * PN-EN 60749-1 (2004-06-15), IDT * PN-EN 60749-1 (2005-08-29), IDT * SS-EN 60749-1 (2003-10-20), IDT * UNE-EN 60749-1 (2004-05-28), IDT * STN EN 60749-1 (2004-01-01), IDT * CSN EN 60749-1 (2003-12-01), IDT * DS/EN 60749-1 (2003-12-11), IDT * NEN-EN-IEC 60749-1:2003 en;fr (2003-08-01), IDT
Tiêu chuẩn liên quan
IEC 60050 Reihe * IEC 60747 Reihe * IEC 60748 Reihe
Thay thế cho
IEC 47/1638/FDIS (2002-06) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t)
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental condition * Environmental testing * Environmental tests * Flammability * Integrated circuits * Mechanical testing * Moisture * Properties * Resistance * Semiconductor devices * Semiconductors * Temperature * Testing * Visual inspection (testing)
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