Số hiệu tiêu chuẩn
IEC 60749-10*CEI 60749-10
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Ngày phát hành
2002-04-00
Tiêu chuẩn tương đương
DIN EN 60749-10 (2003-04), IDT * BS EN 60749-10 (2002-08-28), IDT * EN 60749-10 (2002-08), IDT * NF C96-022-10 (2002-12-01), IDT * OEVE/OENORM EN 60749-10 (2003-10-01), IDT * PN-EN 60749-10 (2003-08-15), IDT * PN-EN 60749-10 (2004-08-23), IDT * SS-EN 60749-10 (2003-10-20), IDT * UNE-EN 60749-10 (2003-05-30), IDT * STN EN 60749-10 (2003-02-01), IDT * CSN EN 60749-10 (2003-04-01), IDT * DS/EN 60749-10 (2003-01-08), IDT * NEN-EN-IEC 60749-10:2002 en;fr (2002-09-01), IDT
Thay thế cho
IEC 47/1598/FDIS (2002-01) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t) * IEC/PAS 62186 (2000-08)
Lịch sử ban hành
IEC 60749-10*CEI 60749-10*IEC 47/1598/FDIS (2002-01)*IEC 60749 (1996-10, t)*IEC 60749 AMD 1 (2000-07, t)*IEC 60749 AMD 2 (2001-10, t)*IEC 60749 Edition 2.2 (2002-04, t)*IEC/PAS 62186 (2000-08) * IEC 60749-10 (2002-04) * IEC 47/1598/FDIS (2002-01) * IEC/PAS 62186 (2000-08) * IEC 47/1534/CDV (2000-07)
Từ khóa
Climate * Climatic tests * Components * Destructive testing * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Mechanical testing * Semiconductor devices * Semiconductors * Shock tests * Testing
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