Số hiệu tiêu chuẩn
IEC 60749-8*CEI 60749-8
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Ngày phát hành
2002-08-00
Tiêu chuẩn tương đương
DIN EN 60749-8 (2003-12), IDT * BS EN 60749-8 (2003-07-03), IDT * EN 60749-8 (2003-06), IDT * NF C96-022-8 (2003-11-01), IDT * OEVE/OENORM EN 60749-8 (2004-01-01), IDT * PN-EN 60749-8 (2004-06-15), IDT * PN-EN 60749-8 (2005-08-31), IDT * UNE-EN 60749-8 (2004-05-28), IDT * STN EN 60749-8 (2004-01-01), IDT * CSN EN 60749-8 (2003-12-01), IDT * DS/EN 60749-8+Corr.2 (2004-02-12), IDT * NEN-EN-IEC 60749-8:2003 en;fr (2003-08-01), IDT
Tiêu chuẩn liên quan
IEC 60068-17 (1994)
Thay thế cho
IEC 47/1574/FDIS (2001-06) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t)
Lịch sử ban hành
IEC 60749-8*CEI 60749-8*IEC 47/1574/FDIS (2001-06)*IEC 60749 (1996-10, t)*IEC 60749 AMD 1 (2000-07, t)*IEC 60749 AMD 2 (2001-10, t)*IEC 60749 Edition 2.2 (2002-04, t) * IEC 60749-8 (2002-08) * IEC 47/1574/FDIS (2001-06) * IEC 47/1431/CDV (1999-04)
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Definitions * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Heat * Integrated circuits * Mechanical testing * Moisture * Resistance * Seals * Semiconductor devices * Semiconductors * Temperature * Testing * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density * Gaskets
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