Số hiệu tiêu chuẩn
EN 60749-8
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + corrigendum 2003)
Ngày phát hành
2003-06-00
Tiêu chuẩn tương đương
DIN EN 60749-8 (2003-12), IDT * BS EN 60749-8 (2003-07-03), IDT * NF C96-022-8 (2003-11-01), IDT * IEC 60749-8 (2002-08), IDT * SN EN 60749-8 (2003-06), IDT * OEVE/OENORM EN 60749-8 (2004-01-01), IDT * PN-EN 60749-8 (2004-06-15), IDT * PN-EN 60749-8 (2005-08-31), IDT * SS-EN 60749-8 (2003-11-17), IDT * UNE-EN 60749-8 (2004-05-28), IDT * TS EN 60749-8 (2008-04-30), IDT * STN EN 60749-8 (2004-01-01), IDT * CSN EN 60749-8 (2003-12-01), IDT * DS/EN 60749-8+Corr.2 (2004-02-12), IDT * NEN-EN-IEC 60749-8:2003 en;fr (2003-08-01), IDT
Thay thế cho
EN 60749 (1999-01, t)
Từ khóa
Atmospheric pressure * Changes of temperature * Climate * Climatic tests * Components * Definitions * Dimensions * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environment * Environmental testing * Environmental tests * Flammability * Heat * Integrated circuits * Mechanical testing * Moisture * Resistance * Seals * Semiconductor devices * Semiconductors * Temperature * Testing * Tightness * Visual inspection (testing) * Impermeability * Freedom from holes * Density * Gaskets