Gives information based on current practice on measurement of certain device parameters, such as collector base cut off current, emitter base cut off current, collector emitter saturation voltage, emitter base voltage with transistor saturated, base emitter forward voltage, cut off frequency and high frequency forward current transfer ratio, common base output capacitance, hybrid parameters, common emitter forward transfer ratio.
Số hiệu tiêu chuẩn
IEC 60147-2*CEI 60147-2
Tên tiêu chuẩn
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods
Ngày phát hành
1963-00-00
Tiêu chuẩn tương đương
DIN 41783 (1981-05), MOD * DIN 41784 (1982-06), MOD * NF C96-112 (1981-10-01), NEQ * NF C96-113 (1980-10-01), NEQ * SEV-ASE 3094-2 (1968-04), IDT * NEN 10147-2 (1981), IDT * NEN 10147-2:1986 en;fr (1986-07-01), IDT
Từ khóa
Electrical engineering * Electronic engineering * Electronic equipment and components * Limits (mathematics) * Measurement * Properties * Semiconductor devices * Semiconductors
IEC 60147-2*CEI 60147-2
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