IEC 60747-7 AMD 1*CEI 60747-7 AMD 1

Semiconductor discrete devices and integrated circuits; part 7: bipolar transistors; amendment 1

1991-05-00

Hết hiệu lực

DIN IEC 60747-7 (1997-12), IDT * SS-IEC 747 (1993-07-30), IDT

IEC 60747-7*CEI 60747-7 (2000-12)

IEC 60747-7*CEI 60747-7 (2010-12) * IEC 60747-7*CEI 60747-7 (2000-12) * IEC 60747-7 AMD 1*CEI 60747-7 AMD 1 (1991-05)

Acceptance * Acceptance inspection * Acceptance tests * Bipolar * Bipolar transistors * Components * Definitions * Discrete * Discrete devices * Electrical engineering * Electronic engineering * Electronic equipment and components * High frequencies * Inspection * Integrated circuits * Layout * Life (durability) * Limits (mathematics) * Low frequencies * Low-frequency engineering * Marking * Measurement * Measuring techniques * Microwave transistors * Operating time * Power transistors * Properties * Radiofrequencies * Radiofrequency apparatus * Ratings * Reference measuring methods * Reference methods * Reliability * Semiconductor devices * Semiconductors * Specification (approval) * Switching transistors * Symbols * Testing * Transistors * Reception

31.080.30. Tranzito

9