Số hiệu tiêu chuẩn
IEC 60749-4*CEI 60749-4
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Ngày phát hành
2002-04-00
Tiêu chuẩn tương đương
DIN EN 60749-4 (2003-04), IDT * BS EN 60749-4 (2002-09-10), IDT * GB/T 4937.4 (2012), IDT * EN 60749-4 (2002-08), IDT * NF C96-022-4 (2002-12-01), IDT * OEVE/OENORM EN 60749-4 (2003-10-01), IDT * PN-EN 60749-4 (2003-10-15), IDT * PN-EN 60749-4 (2004-08-23), IDT * SS-EN 60749-4 (2003-10-20), IDT * UNE-EN 60749-4 (2003-05-30), IDT * TS EN 60749-4 (2004-04-15), IDT * STN EN 60749-4 (2003-02-01), IDT * CSN EN 60749-4 (2003-04-01), IDT * DS/EN 60749-4 (2003-01-08), IDT * NEN-EN-IEC 60749-4:2002 en;fr (2002-09-01), IDT
Thay thế cho
IEC 47/1532A/CDV (2000-07) * IEC 47/1602/FDIS (2002-01) * IEC 60749 (1996-10, t) * IEC 60749 AMD 1 (2000-07, t) * IEC 60749 AMD 2 (2001-10, t) * IEC 60749 Edition 2.2 (2002-04, t) * IEC/PAS 62177 (2000-08)
Từ khóa
Climate * Climatic tests * Components * Damp-heat tests * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Environmental testing * Integrated circuits * Mechanical testing * Semiconductor devices * Semiconductors * Stress tests * Testing
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