EN 12544-3

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3: Spectrometric method

1999-09-00

Có hiệu lực

DIN EN 12544-3 (1999-12), IDT * BS EN 12544-3 (1999-12-15), IDT * NF A09-230-3 (1999-11-01), IDT * ISO/DIS 16526-3 (2010-11), IDT * SN EN 12544-3 (1999-12), IDT * OENORM EN 12543-3 (1999-12-01), IDT * OENORM EN 12544-3 (1999-12-01), IDT * PN-EN 12544-3 (2003-06-30), IDT * SS-EN 12544-3 (1999-09-30), IDT * UNE-EN 12544-3 (2000-04-17), IDT * TS EN 12544-3 (2002-03-25), IDT * UNI EN 12544-3:2003 (2003-04-01), IDT * STN EN 12544-3 (2001-11-01), IDT * CSN EN 12544-3 (2001-02-01), IDT * DS/EN 12544-3 (2002-03-08), IDT * NEN-EN 12544-3:1999 en (1999-10-01), IDT * SFS-EN 12544-3:en (2001-07-18), IDT

prEN 12544-3 (1999-04)

EN 12544-3 (1999-09) * prEN 12544-3 (1999-04) * prEN 12544-3 (1996-11)

Contrast (optical) * Definitions * Direct voltage * High voltage * Image quality * Interpretations * Materials testing * Measurement * Methods * Non-destructive * Non-destructive testing * Radiation protection * Radiographs * Spectrometers * Spectrometry * Testing * Valve voltages * Voltage * Voltage measuring * X-ray plants * X-ray tubes * X-rays * Processes * Procedures * Stress

19.100. Thử không phá hủy và thiết bị

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