IEC 60747-7-5*CEI 60747-7-5

Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications

2005-08-00

Hết hiệu lực

BS IEC 60747-7-5 (2006-01-19), IDT * NEN-IEC 60747-7-5:2005 en (2005-08-01), IDT

IEC 60747-7*CEI 60747-7 (2000-12) * IEC 60747-1 (1983)

IEC 47E/279/FDIS (2005-04)

IEC 60747-7*CEI 60747-7 (2010-12)

IEC 60747-7*CEI 60747-7 (2010-12) * IEC 60747-7-5 (2005-08) * IEC 47E/279/FDIS (2005-04) * IEC 47E/252/CDV (2004-01)

Acceptance inspection * Acceptance tests * Bipolar * Bipolar transistors * Components * Definitions * Discrete devices * Electrical engineering * Electronic engineering * Electronic equipment and components * High frequencies * Inspection * Integrated circuits * Layout * Life (durability) * Limits (mathematics) * Low frequencies * Low-frequency engineering * Marking * Measurement * Measuring techniques * Operating time * Power transistors * Properties * Radiofrequencies * Radiofrequency apparatus * Ratings * Reference measuring methods * Reference methods * Reliability * Semiconductor devices * Semiconductors * Specification (approval) * Switching transistors * Symbols * Testing * Transistors

31.080.30. Tranzito

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