Số hiệu tiêu chuẩn
EN 60749-27
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006)
Ngày phát hành
2006-08-00
Tiêu chuẩn tương đương
DIN EN 60749-27 (2007-01), IDT * DIN EN 60749-27 (2013-04), IDT * BS EN 60749-27+A1 (2006-09-29), IDT * NF C96-022-27 (2006-12-01), IDT * IEC 60749-27 (2006-07), IDT * SN EN 60749-27 (2006), IDT * OEVE/OENORM EN 60749-27 (2007-03-01), IDT * OEVE/OENORM EN 60749-27 (2013-07-01), IDT * PN-EN 60749-27 (2006-11-28), IDT * PN-EN 60749-27 (2008-02-05), IDT * SS-EN 60749-27 (2006-11-20), IDT * STN EN 60749-27 (2007-05-01), IDT * CSN EN 60749-27 (2007-03-01), IDT * DS/EN 60749-27 (2006-12-21), IDT * NEN-EN-IEC 60749-27:2007 en;fr (2007-11-01), IDT
Từ khóa
Atmospheric pressure * Changes of temperature * Classification * Classification systems * Climate * Climatic tests * Components * Definitions * Dimensions * Discharge * Electrical components * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Electrostatic * Electrostatic discharges * Electrostatics * Environment * Environmental testing * Environmental tests * Flammability * Heat * Impulse loadability * Integrated circuits * Machines * Measuring equipment * Mechanical testing * Models * Moisture * Resistance * Semiconductor devices * Semiconductors * Sensitivity * Simulation * Temperature * Testing * Testing devices * Visual inspection (testing) * Checking equipment * Engines * Patterns