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IEC 60444-2*CEI 60444-2

Measurement of quartz crystal unit parameters by zero phase technique in a ?-network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units

Số trang: 18
Ngày phát hành: 1980-00-00

Liên hệ
Describes a method suitable for measurement in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5 %. This method is based on the phase measurement at the resonance frequency and in its vicinity. The value of the motional capacitance is calculated from the measured values of resonance frequency, two frequencies lying on both sides of the impedance curve with a given phase difference equal in magnitude and opposite in sign, and the resonance resistance. The measuring circuit consists basically of a ?-network connected with coaxial cables to the associated equipment.
Số hiệu tiêu chuẩn
IEC 60444-2*CEI 60444-2
Tên tiêu chuẩn
Measurement of quartz crystal unit parameters by zero phase technique in a ?-network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
Ngày phát hành
1980-00-00
Trạng thái
Có hiệu lực
Tiêu chuẩn tương đương
DIN 45105-5 (1987-03), IDT * DIN 45105-5 (1984-08), MOD * DIN EN 60444-2 (1997-10), IDT * DIN IEC 60444-2 (1992-11), IDT * DIN IEC 60444-2 (1991-11), IDT * BS 7681 PART 2 (1993), IDT * BS EN 60444-2 (1993-09-15), IDT * EN 60444-2 (1997-04), IDT * prEN 60444-2 (1996-07), IDT * NF C93-622 (2001-07-01), IDT * C93-622, IDT * SEV-ASE 3222-2 (1987), IDT * OEVE EN 60444-2 (1997-06-03), IDT * PN-IEC 444-2 (1996-02-05), IDT * PN-IEC 444-2/Ap1 (1999-05-21), IDT * SS-EN 60444-2 (1998-02-27), IDT * NEN 10444-2 (1982), IDT * STN EN 60444-2 (2000-12-01), IDT * CSN EN 60444-2 (1998-09-01), IDT * DS/EN 60444-2 (1998-06-08), IDT * NEN-EN-IEC 60444-2:1997 en;fr (1997-08-01), IDT * NEN 10444-2:1982 en;fr (1982-06-01), IDT
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Thay thế bằng
Lịch sử ban hành
IEC 60444-2*CEI 60444-2 (1980)
Measurement of quartz crystal unit parameters by zero phase technique in a ?-network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
Số hiệu tiêu chuẩn IEC 60444-2*CEI 60444-2
Ngày phát hành 1980-00-00
Mục phân loại 31.140. Dụng cụ áp điện
Trạng thái Có hiệu lực
Từ khóa
Capacitance measurement * Circuit networks * Connections for measurement * Crystals (electronic) * Dynamic * Electrical engineering * Measurement * Measuring accuracy * Measuring techniques * Motional * Parameters * Phase measurement (electric) * Phase offset method * Piezoelectric * Piezoelectric devices * Piezoelectricity * Principle of measurement * Zero phase * Zero-method
Mục phân loại
31.140. Dụng cụ áp điện
Số trang
18

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