Số hiệu tiêu chuẩn
IEC 60749-26*CEI 60749-26
Tên tiêu chuẩn
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Ngày phát hành
2006-07-00
Tiêu chuẩn tương đương
DIN EN 60749-26 (2007-01), IDT * ABNT NBR IEC 60749-26 (2011-02-28), IDT * BS EN 60749-26 (2006-09-29), IDT * EN 60749-26 (2006-08), IDT * NF C96-022-26 (2006-12-01), IDT * OEVE/OENORM EN 60749-26 (2007-03-01), IDT * PN-EN 60749-26 (2006-11-28), IDT * PN-EN 60749-26 (2008-01-24), IDT * SS-EN 60749-26 (2006-11-20), IDT * STN EN 60749-26 (2007-05-01), IDT * CSN EN 60749-26 (2007-03-01), IDT * NEN-EN-IEC 60749-26:2007 en;fr (2007-11-01), IDT
Lịch sử ban hành
IEC 60749-26*CEI 60749-26 (2013-04) * IEC 60749-26 (2006-07) * IEC 47/1859/FDIS (2006-03) * IEC 47/1803/CDV (2005-01) * IEC 60749-26 (2003-10) * IEC 47/1703/FDIS (2003-06) * IEC 47/1623/CDV (2002-04) * IEC/PAS 62179 (2000-08)
Từ khóa
Atmospheric pressure * Changes of temperature * Checking equipment * Classification * Classification systems * Climate * Climatic tests * Components * Definitions * Dimensions * Discharge * Electrical components * Electrical engineering * Electrical measurement * Electronic engineering * Electronic equipment and components * Electrostatic * Electrostatic discharges * Electrostatics * Environment * Environmental testing * Environmental tests * Failure * Flammability * Heat * Human body * Impulse loadability * Integrated circuits * Measuring equipment * Mechanical testing * Models * Moisture * Resistance * Semiconductor devices * Semiconductors * Simulation * Temperature * Testing * Testing devices * Visual inspection (testing) * Patterns